Our Aim in running these courses is to give an overview of X-ray Microanalysis Techniques including Energy Dispersive Analysis, Wavelength Dispersive Analysis, X-ray Mapping, Full Spectrum Mapping and Feature Recognition. Since the courses are 'hands-on', the number of participants is strictly limited, so please register your application early.
Next Course:Nov 10 to 14 2008.
These courses will be conducted at the University of Technology Sydney.
Microstructural Analysis Unit Level 1, Building 4, Cnr Thomas & Harris Sts, Ultimo, NSW 2007
Course Content:
Hands-On Microanalysis Techniques.
SEM: This course teaches Scanning Electron Microscopy including construction and components. For example, Electron Guns, Beam Stability, Vacuum Systems, Electron and X-ray Signals, Column Alignment, Filament Saturation and Alignment, Beam Current Measurement and Regulation, Aperture Selection and Alignment, Astigmatism Correction, Sample Placement, Image Capture, Saving Images, Length Measurement etc. If this knowledge needs 'bringing up to scratch' you are welcome to attend our Beginner's Course where all these factors and their significance for microanalysis work, will be explained.
EDS: Determination of keV, Resolution v's Count rate, Spectrum stripping and Overlap correction, Deadtime correction, Standardless v's Standards analysis, Major and Trace Element Analysis, Quantitative Element Analysis, Thin film Corrections, Pseudo Standards, Light Element Analysis, CuL to CuK ratio, Calibration, Pulse Pile up, Spectra comparison, Labelling and Peak Identification, Take-off Angle and Sample Placement Requirements and Positioning, Looking for Artifacts, Specimen Preparation Techniques, Standards, Coating Requirements, Report Software
WDS: Wavelength scans, Peak resolution c.f. EDS, Peak to Background Ratios compared to EDS, Detection Limits, X-Ray count chain electronics, Peak and Background Measurement Positions, Pulse Height Determinations, Mechanical requirements such as 'Which crystal and detector type to use for which elements?', Standards Selection, Standardisation and Analysis Techniques including Major and Trace Quantitative Element Analysis, Combined EDS / WDS Analysis, Light Element Analysis,
XRM: Collection Strategies, Display of Data, Major and Trace Quantitative Element Analysis, Quantitative Mapping and Line Profiles, Detection Limits, Combined EDS / WDS Mapping, Light Element Mapping, Chemical Imaging
Demonstrations and hands-on will be undertaken on UTS Instrumentation.
Moran Scientific Probes have 4 WDS spectrometers, and 3 simultaneous EDS spectrometers and X-ray Mapping systems. Off line demonstrations will also be available if required. If you are having trouble analysing a particular specimen, bring it along with you.